Dr. Martin Míka
at Institute of Chemical Technology
SPIE Involvement:
Author
Publications (15)

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10567, International Conference on Space Optics — ICSO 2006
KEYWORDS: Wafer-level optics, Mirrors, X-ray optics, Glasses, Silicon, Space telescopes, Astronomical imaging, X-ray telescopes, Semiconducting wafers, X-ray technology

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10566, International Conference on Space Optics — ICSO 2008

PROCEEDINGS ARTICLE | May 9, 2013
Proc. SPIE. 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
KEYWORDS: Mirrors, Silica, Crystals, X-rays, Silicon, Heat treatments, Space telescopes, X-ray telescopes, Semiconducting wafers, Surface finishing

PROCEEDINGS ARTICLE | December 18, 2012
Proc. SPIE. 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics
KEYWORDS: Glasses, Luminescence, Ions, Semiconductor lasers, Erbium, Laser glasses, Laser optics, Printed circuit board testing, Erbium lasers, Absorption

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Mirrors, X-ray optics, Data modeling, Glasses, X-rays, Silicon, Computer simulations, Space telescopes, X-ray telescopes, X-ray technology

PROCEEDINGS ARTICLE | May 24, 2011
Proc. SPIE. 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II
KEYWORDS: Wafer-level optics, Semiconductors, Mirrors, X-ray optics, X-rays, Silicon, Space telescopes, X-ray telescopes, Semiconducting wafers, Surface finishing

Showing 5 of 15 publications
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