Martin H. U. Prinzler
at Bremer Institut für angewandte Strahltechnik GmbH
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 4, 2018
Proc. SPIE. 10750, Reflection, Scattering, and Diffraction from Surfaces VI
KEYWORDS: Metrology, Visual process modeling, Imaging systems, Cameras, Calibration, CCD cameras, Optical metrology, Optical calibration, Precision calibration

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Displays, Visual process modeling, Reflection, Cameras, Calibration, Deflectometry, Refraction, Phase measurement, Model-based design, Device simulation

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top