Martin Reufer
at Ludwig-Maximilians-Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 25, 2008
Proc. SPIE. 6876, High-Power Diode Laser Technology and Applications VI
KEYWORDS: External quantum efficiency, Resonators, High power lasers, Laser applications, Resistance, Nd:YAG lasers, Multiplexing, Semiconductor lasers, Laser damage threshold, Laser systems engineering

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