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Dr. Martin Veselý
at Utrecht Univ
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Publications (1)
Proceedings Article | 9 September 2019 Presentation + Paper
Full-field hard X-ray microscopy based on aberration-corrected Be CRLs
Andreas Schropp, Dennis Brückner, Jessica Bulda, Gerald Falkenberg, Jan Garrevoet, Johannes Hagemann, Frank Seiboth, Kathryn Spiers, Frieder Koch, Christian David, Marianna Gambino, Martin Veselý, Florian Meirer, Christian Schroer
Proceedings Volume 11112, 1111208 (2019) https://doi.org/10.1117/12.2528422
KEYWORDS: Beryllium, X-rays, X-ray microscopy, Microscopy, X-ray optics, Tomography, Hard x-rays, Spatial resolution, Lenses
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