Marvin Becker
at Institut Franco Allemand;Gendarmerie de l Armement
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2019 Paper
Proc. SPIE. 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV
KEYWORDS: Signal to noise ratio, Imaging systems, Cameras, Image processing, Photons, X-rays, Scintillators, Image quality, Image intensifiers, X-ray imaging

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top