Marvin Becker
at Institut Franco Allemand;Gendarmerie de l Armement
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2019
Proc. SPIE. 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV
KEYWORDS: X-rays, Scintillators, Signal to noise ratio, X-ray imaging, Image intensifiers, Image quality, Cameras, Image processing, Imaging systems, Photons

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