Prof. Masato Aketagawa
Professor at Nagaoka Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (17)

SPIE Journal Paper | November 20, 2018
OE Vol. 57 Issue 11
KEYWORDS: Interferometers, Mirrors, Michelson interferometers, Signal processing, Interferometry, Fringe analysis, Pulsed laser operation, Light sources, Fourier transforms, Communication theory

PROCEEDINGS ARTICLE | November 7, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Phase modulation, Modulation, Interferometers, Sensors, Phase measurement, Signal detection

PROCEEDINGS ARTICLE | November 6, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Phase modulation, Interferometers, Data storage, Interferometry, Phase shift keying, Field programmable gate arrays, Linear filtering, Heterodyning, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | November 2, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Fringe analysis, Interferometers, Fourier transforms, Distance measurement

PROCEEDINGS ARTICLE | May 28, 2018
Proc. SPIE. 10695, Optical Instrument Science, Technology, and Applications
KEYWORDS: Phase modulation, Modulation, Interferometers, Image processing, Demodulation, Data acquisition, Frequency modulation, Signal detection

PROCEEDINGS ARTICLE | February 28, 2017
Proc. SPIE. 10256, Second International Conference on Photonics and Optical Engineering
KEYWORDS: Optical fibers, Refractive index, Femtosecond phenomena, Interferometers, Frequency combs, Optical communications, Fiber optic communications, Pulsed laser operation, Environmental sensing, Standards development

Showing 5 of 17 publications
Conference Committee Involvement (6)
Optical Metrology and Inspection for Industrial Applications VI
20 October 2019 | Hangzhou, China
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
Showing 5 of 6 published special sections
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