Masato Hoshino
Fabrication & Testing at Univ of Tsukuba
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 18, 2004
Proc. SPIE. 5533, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications II
KEYWORDS: Microscopes, Mirrors, Polishing, Spatial frequencies, Glasses, X-rays, Surface roughness, Objectives, X-ray imaging, Surface finishing

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