Prof. Masayuki Yokota
Professor at Shimane Univ
SPIE Involvement:
Publications (18)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Light sources, Holograms, Digital holography, Modulation, Polarization, Cameras, Semiconductor lasers, Frequency modulation, CMOS cameras, Signal detection

Proceedings Article | 26 June 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Microscopes, Holograms, 3D image reconstruction, Digital holography, Speckle, Glasses, Image processing, Denoising, Microscopy, Inspection, Data acquisition, Charge-coupled devices, Holographic interferometry, Phase shifts

Proceedings Article | 3 December 2014
Proc. SPIE. 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors
KEYWORDS: Mirrors, Beam splitters, Holography, Digital holography, Defect detection, Metals, Copper, Inspection, Distortion, Charge-coupled devices

SPIE Journal Paper | 15 October 2014
OE Vol. 53 Issue 10
KEYWORDS: Digital holography, Inspection, Copper, Mirrors, Holography, Charge-coupled devices, Semiconductor lasers, Defect detection, Holograms, Distortion

Proceedings Article | 13 May 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Mirrors, Holograms, Holography, Digital holography, Copper, Inspection, Distortion, Semiconductor lasers, Charge-coupled devices, Phase shifts

Showing 5 of 18 publications
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