Mathias Ziegler
at Max-Born-Institut für NOK
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 26 February 2010 Paper
Proc. SPIE. 7597, Physics and Simulation of Optoelectronic Devices XVIII
KEYWORDS: Mirrors, Quantum wells, Aluminium gallium indium phosphide, High power lasers, Solids, Optical simulations, Electro optical modeling, Nonabsorbing mirrors, Temperature metrology, Absorption

Proceedings Article | 12 February 2010 Paper
Proc. SPIE. 7616, Novel In-Plane Semiconductor Lasers IX
KEYWORDS: Thermography, Mirrors, Quantum wells, Continuous wave operation, Cameras, Semiconductor lasers, Scanning electron microscopy, Temporal resolution, Pulsed laser operation, Temperature metrology

Proceedings Article | 3 February 2009 Paper
Proc. SPIE. 7230, Novel In-Plane Semiconductor Lasers VIII
KEYWORDS: Thermography, Cameras, High power lasers, Semiconductor lasers, Finite element methods, Spatial resolution, Thermal modeling, Quantum dot lasers, Temperature metrology, Instrument modeling

Proceedings Article | 3 February 2009 Paper
Proc. SPIE. 7230, Novel In-Plane Semiconductor Lasers VIII
KEYWORDS: Thermography, Infrared imaging, Quantum wells, Cameras, Semiconductor lasers, Infrared radiation, Optical damage, Temperature metrology, Near field optics, Absorption

Proceedings Article | 8 May 2008 Paper
Proc. SPIE. 6997, Semiconductor Lasers and Laser Dynamics III
KEYWORDS: Thermography, Aluminium gallium indium phosphide, Waveguides, Cameras, Physics, Electroluminescence, Semiconductor lasers, Near field, Temperature metrology, Absorption

Showing 5 of 9 publications
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