Dr. Mathieu Morelle
at Katholieke Univ Leuven
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 September 2005
Proc. SPIE. 5932, Strongly Correlated Electron Materials: Physics and Nanoengineering
KEYWORDS: Resistance, Magnetism, Superconductors, Atomic force microscopy, Scanning electron microscopy, Quantization, Aluminum, Phase measurement, Photomicroscopy, Superconductivity

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