Dr. Matthew Hand
at Diamond Light Source Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Ion beams, Ions, Ion beam finishing, Mirrors, Metrology, X-rays, X-ray optics, Synchrotrons, Optical metrology, Optics manufacturing

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