Dr. Matthew J. Novak
Sr. Staff Applications Engineer at Synopsys
SPIE Involvement:
Senior status | Conference Program Committee | Author
Websites:
Publications (12)

Proceedings Article | 23 August 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Polarization, Imaging systems, Glasses, Manufacturing, Inspection, Optical inspection, Line scan cameras, High volume manufacturing, Laser systems engineering

Proceedings Article | 1 September 2015
Proc. SPIE. 9576, Applied Advanced Optical Metrology Solutions
KEYWORDS: Microscopes, Mirrors, Visualization, Cameras, Image processing, Interferometry, 3D metrology, Objectives, 3D image processing, RGB color model

Proceedings Article | 13 November 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Microscopes, Mirrors, Interferometers, Scanners, Error analysis, Demodulation, 3D metrology, Optical interferometry, 3D scanning, Spherical lenses

Proceedings Article | 5 August 2010
Proc. SPIE. 7733, Ground-based and Airborne Telescopes III
KEYWORDS: Telescopes, Mirrors, Polishing, Error analysis, Computer generated holography, Monte Carlo methods, Aspheric lenses, Optical alignment, Spherical lenses, Tolerancing

Proceedings Article | 23 July 2010
Proc. SPIE. 7739, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation
KEYWORDS: Mirrors, Polishing, Metrology, Photography, Interferometry, Optical fabrication, Computer generated holography, Laser interferometry, Aspheric lenses, Surface finishing

Showing 5 of 12 publications
Conference Committee Involvement (2)
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Applied Advanced Optical Metrology Solutions
11 August 2015 | San Diego, California, United States
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