Matthew Oldfield
at STFC Rutherford Appleton Lab
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 6 September 2019 Paper
Y. J. Han, J. Partington, R. Chhantyal-Pun, E. Nuttall, M. Henry, O. Auriacombe, T. Rawlings, L. H. Li, J. Keeley, M. Oldfield, N. Brewster, R. Dong, P. Dean, A. G. Davies, B. N. Ellison, E. H. Linfield, A. Valavanis
Proceedings Volume 11124, 111240Q (2019) https://doi.org/10.1117/12.2528683
KEYWORDS: Quantum cascade lasers, Terahertz radiation, Modes of laser operation, Waveguides, Absorption, Spectroscopy, Spectroscopes, Terahertz spectroscopy, Continuous wave operation, Chemical analysis

Proceedings Article | 12 May 2016 Paper
Hui Wang, Matthew Oldfield, Itziar Maestrojuán, Duncan Platt, Nick Brewster, Colin Viegas, Byron Alderman, Brian Ellison
Proceedings Volume 9830, 983008 (2016) https://doi.org/10.1117/12.2229246
KEYWORDS: Receivers, Diodes, Antennas, Waveguides, Sensors, Imaging systems, Oscillators, Information security, Radiometry, Amplifiers

Proceedings Article | 15 July 2010 Paper
Yoonjae Lee, Brian Ellison, Peter Huggard, Mark Harman, Abdelhakim Boughriet, Wojciech Bartynowski, Matthew Oldfield, Nigel Morris, Peter Hekman, Gie Han Tan
Proceedings Volume 7741, 77412K (2010) https://doi.org/10.1117/12.857302
KEYWORDS: Receivers, Calibration, Fourier transforms, Reflectivity, Temperature metrology, Cryogenics, Reflection, Liquids, Absorption, Polarization

Proceedings Article | 2 October 2008 Paper
P. Huggard, M. Oldfield, B. Moyna, B. Ellison, D. Matheson, A. Bennett, C. Gaffard, T. Oakley, J. Nash
Proceedings Volume 7117, 711704 (2008) https://doi.org/10.1117/12.800347
KEYWORDS: Radar, Clouds, Knowledge management, Antennas, Meteorology, Oscillators, Electronic filtering, Linear filtering, Crystals, Receivers

Proceedings Article | 2 October 2008 Paper
Proceedings Volume 7117, 71170N (2008) https://doi.org/10.1117/12.800258
KEYWORDS: Diodes, Terahertz technology, Receivers, Gallium arsenide, Amplifiers, Sensors, Electromagnetism, Terahertz radiation, Imaging systems, Semiconducting wafers

Showing 5 of 7 publications
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