Prof. Matthew C. Stamm
at Drexel Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2015 Paper
Owen Mayer, Matthew Stamm
Proceedings Volume 9409, 94090M (2015) https://doi.org/10.1117/12.2182457
KEYWORDS: Chromatic aberrations, Forensic science, Error analysis, Cameras, Sensors, Digital imaging, Databases, Image processing, Algorithm development, Channel projecting optics

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