Matthew Tedaldi
Application Engineer at Infinitesima Ltd
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11611, 116110J (2021) https://doi.org/10.1117/12.2583065
KEYWORDS: 3D metrology, Microscopy, Metrology, Switching, Tomography, Semiconductor manufacturing, Gallium arsenide, Diamond, 3D equipment, Transmission electron microscopy

Proceedings Article | 20 March 2020 Paper
Proceedings Volume 11325, 113252H (2020) https://doi.org/10.1117/12.2551693
KEYWORDS: Microscopes, Image quality, Photomasks, Metrology, 3D metrology, Manufacturing, Semiconducting wafers, Line edge roughness, Chemical mechanical planarization, Structural design

Proceedings Article | 27 May 2011 Paper
Triantafillos Koukoulas, William Broughton, Matthew Tedaldi, Pete Theobald
Proceedings Volume 8082, 808220 (2011) https://doi.org/10.1117/12.889190
KEYWORDS: Dispersion, Particles, Polymers, Wavefronts, Nanocomposites, Dynamic light scattering, Optical coherence tomography, Linear filtering, Diffusion, Diffraction

Proceedings Article | 20 February 2009 Paper
Matthew Tedaldi, Peter Woolliams, Christian Hart, Andrew Beaumont, Pete Tomlins
Proceedings Volume 7171, 71710V (2009) https://doi.org/10.1117/12.809090
KEYWORDS: Refractive index, Optical coherence tomography, Refractometry, Geometrical optics, Radon transform, Silica, Coherence (optics), Interfaces, Interferometry, Laser beam diagnostics

Proceedings Article | 18 February 2008 Paper
Peter Tomlins, Peter Woolliams, Matthew Tedaldi, Andrew Beaumont, Christian Hart
Proceedings Volume 6847, 68472Q (2008) https://doi.org/10.1117/12.766576
KEYWORDS: Optical coherence tomography, Particles, Point spread functions, 3D acquisition, 3D image processing, Optical spheres, Imaging systems, Image resolution, Calibration, Spectral resolution

Showing 5 of 7 publications
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