Matthias Fill
at Camlin Technologies (Switzerland) AG
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 February 2012
Proc. SPIE. 8242, Vertical External Cavity Surface Emitting Lasers (VECSELs) II
KEYWORDS: Mid-IR, Mirrors, Quantum wells, Crystals, Silicon, Applied physics, Group IV-VI semiconductors, Temperature metrology, Lead, Absorption

Proceedings Article | 2 September 2009
Proc. SPIE. 7453, Infrared Spaceborne Remote Sensing and Instrumentation XVII
KEYWORDS: Microelectromechanical systems, Mid-IR, Mirrors, Tunable lasers, Quantum wells, Sensors, Silicon, Diffusion, Photodiodes, Temperature metrology

Proceedings Article | 28 February 2009
Proc. SPIE. 7193, Solid State Lasers XVIII: Technology and Devices
KEYWORDS: Mid-IR, Refractive index, Mirrors, Quantum wells, Silicon, Aluminum, Optical pumping, Vertical external cavity surface emitting lasers, Temperature metrology

Proceedings Article | 3 September 2008
Proc. SPIE. 7082, Infrared Spaceborne Remote Sensing and Instrumentation XVI
KEYWORDS: Microelectromechanical systems, Mid-IR, Mirrors, Sensors, Silicon, Diffusion, Reflectivity, Photodiodes, Diodes, Micromirrors

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