Dr. Matthias Kreisler
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 June 2002 Paper
Matthias Kreisler, Juergen Schoof, Ernst Langnau, Haitham Al Haj, Bernd d'Hoedt
Proceedings Volume 4610, (2002) https://doi.org/10.1117/12.469329
KEYWORDS: Bone, Semiconductor lasers, Temperature metrology, Natural surfaces, In vivo imaging, Laser dentistry, Titanium, Optical simulations, Tissues, Continuous wave operation

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