Dr. Matthias List
at Von Ardenne Anlagentechnik
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Refractive index, Multilayers, Sputter deposition, Optical coatings, Oxygen, Transmittance, Deposition processes, Niobium, Plasma

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