Dr. Matthias Schicke
Global Key Account Manager at FUJIFILM Electronic Materials
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 8, 2004
Proc. SPIE. 5498, Millimeter and Submillimeter Detectors for Astronomy II
KEYWORDS: Microelectromechanical systems, Molecular bridges, Capacitors, Electrodes, Digital filtering, Superconductors, Capacitance, Bridges, Niobium, Bandpass filters

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