Dr. Maurizio Vannoni
Researcher at European XFEL GmbH
SPIE Involvement:
Conference Co-Chair | Conference Program Committee | Author
Publications (25)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Photovoltaics, Mirrors, Femtosecond phenomena, Scattering, Spectroscopy, Photons, X-rays, Laser scattering, Interferometry, Steiner quadruple pulse system

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Cooling systems, Mirrors, Polishing, Metrology, Femtosecond phenomena, Photons, X-rays, Coating, Grazing incidence, Surface finishing

PROCEEDINGS ARTICLE | June 14, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Diffraction, Mirrors, X-ray optics, Polishing, Metrology, X-ray sources, Interferometry, Adaptive optics, Free electron lasers, Surface finishing

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9965, Adaptive X-Ray Optics IV
KEYWORDS: Actuators, Mirrors, Mirrors, Sensors, Sensors, Calibration, X-rays, Silicon, Control systems, X-ray characterization, X-ray characterization, Temperature metrology, Fizeau interferometers, Fizeau interferometers

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Optical components, Mirrors, X-ray optics, Metrology, Calibration, X-rays, X-rays, Inspection, Interferometry, Interferometry, Wavefronts, Grazing incidence

PROCEEDINGS ARTICLE | June 21, 2015
Proc. SPIE. 9526, Modeling Aspects in Optical Metrology V
KEYWORDS: Optical filters, Mirrors, Metrology, X-rays, Interferometry, Wavefronts, Linear filtering, Electronic filtering, Grazing incidence, Fizeau interferometers

Showing 5 of 25 publications
Conference Committee Involvement (4)
Adaptive X-Ray Optics V
19 August 2018 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Adaptive X-Ray Optics IV
28 August 2016 | San Diego, California, United States
Adaptive X-Ray Optics III
17 August 2014 | San Diego, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top