Maxim Bakshaev
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Near infrared, Diffraction, Spectrographs, Optical design, Visible radiation, Holography, Image quality, Volume holography, Tolerancing, Diffraction gratings

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top