Maxim Drosdetsky
at National Research Nuclear Univ MEPhI
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 30 December 2016
Proc. SPIE. 10224, International Conference on Micro- and Nano-Electronics 2016
KEYWORDS: Oxides, Annealing, Interfaces, Diffusion, Power supplies, Capacitance, Transistors, Field effect transistors, Modeling and simulation, Instrument modeling

Proceedings Article | 18 December 2014
Proc. SPIE. 9440, International Conference on Micro- and Nano-Electronics 2014
KEYWORDS: Oxides, Switching, Annealing, Electrons, Interfaces, Thermal effects, Integrated circuits, Modeling and simulation, Analog electronics, Temperature metrology

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