Dr. Maxim R. Shcherbakov
Postdoc at Cornell Univ
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | September 17, 2018
Proc. SPIE. 10722, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVI
KEYWORDS: Semiconductors, Refractive index, FT-IR spectroscopy, Spectroscopy, Particles, Silicon, Nondestructive evaluation, Sapphire, Fluorescence correlation spectroscopy, Harmonic generation

PROCEEDINGS ARTICLE | May 23, 2018
Proc. SPIE. 10672, Nanophotonics VII
KEYWORDS: Fabrication, Optomechanical design, Medicine, Nanoparticles, Particles, Dielectrics, Silicon, Photonics, Nonlinear optics, Optical sorting

PROCEEDINGS ARTICLE | March 14, 2018
Proc. SPIE. 10541, Photonic and Phononic Properties of Engineered Nanostructures VIII
KEYWORDS: Semiconductors, Metamaterials, Mid-IR, Plasmonics, Beam splitters, Spectroscopy, Photonic crystals, Antennas, Nanophotonics, Photonic crystal devices

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10346, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XV
KEYWORDS: Semiconductors, Ultrafast phenomena, Plasmonics, Nanostructures, Electron beam lithography, Silicon, Nonlinear optics, Plasma enhanced chemical vapor deposition, Nanolithography, Optical semiconductors

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10113, High Contrast Metastructures VI
KEYWORDS: Plasmonics, Nanoparticles, Dielectrics, Silicon, Complex systems, Magnetism, Third-harmonic generation, Nanophotonics, Nonlinear response, Resonance enhancement

PROCEEDINGS ARTICLE | November 9, 2016
Proc. SPIE. 9921, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIV
KEYWORDS: Amorphous silicon, Thin films, Nanostructures, Femtosecond phenomena, Optical properties, Glasses, Spectroscopy, Polarizers, Nonlinear optics, Plasma enhanced chemical vapor deposition

Showing 5 of 12 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top