Dr. Maxim N. Shkunov
Senior Lecturer at University of Surrey
SPIE Involvement:
Publications (12)

SPIE Journal Paper | 27 June 2018
John Dear, Christopher Poll, Khue Lai, Maxim Shkunov
JPE, Vol. 8, Issue 03, 032221, (June 2018) https://doi.org/10.1117/12.10.1117/1.JPE.8.032221
KEYWORDS: Thin films, Resistance, Annealing, Transparent conducting films, Carbon nanotubes, Raman spectroscopy, FT-IR spectroscopy, Transparency, Carbon monoxide, Nitrogen

Proceedings Article | 17 September 2009 Paper
Christopher Mills, Akarin Intaniwet, Maxim Shkunov, Joseph Keddie, Paul Sellin
Proceedings Volume 7449, 74491I (2009) https://doi.org/10.1117/12.829619
KEYWORDS: Polymers, Diodes, X-rays, Semiconductors, Polymer thin films, Gold, Electrodes, Sensors, Luminescence, Aluminum

Proceedings Article | 25 August 2006 Paper
Rick Hamilton, Clare Bailey, Warren Duffy, Martin Heeney, Maxim Shkunov, David Sparrowe, Steve Tierney, Iain McCulloch, R. Joseph Kline, Dean DeLongchamp, Michael Chabinyc
Proceedings Volume 6336, 633611 (2006) https://doi.org/10.1117/12.682874
KEYWORDS: Polymers, Thin films, Field effect transistors, Transistors, Semiconductors, Crystals, Thin film devices, Measurement devices, Argon, Liquids

Proceedings Article | 30 August 2005 Paper
Martin Heeney, Clare Bailey, Kristijonas Genevicius, Mark Giles, Maxim Shkunov, David Sparrowe, Steve Tierney, Weimin Zhang, Iain McCulloch
Proceedings Volume 5940, 594007 (2005) https://doi.org/10.1117/12.614778
KEYWORDS: Polymers, Field effect transistors, Transistors, Magnesium, Semiconductors, Nitrogen, Silica, Sodium, Crystals, Glasses

Proceedings Article | 8 September 2004 Paper
Maxim Shkunov, Weimin Zhang, Clare Bailey, Bryan Fleming, Mark Giles, Martin Heeney, Iain Love, David Sparrowe, Steve Tierney, Iain McCulloch, Martin Nielsen, Dag Breiby, Oliver Bunk
Proceedings Volume 5464, (2004) https://doi.org/10.1117/12.545729
KEYWORDS: Field effect transistors, Liquid crystals, Transistors, Molecules, Crystals, Semiconductors, Liquids, Targeting Task Performance metric, Molecular self-assembly, Temperature metrology

Showing 5 of 12 publications
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