Mr. Maxime Bernier
at LCIS
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Refractive index, Modulation, Sensors, Crystals, Dielectrics, Electro optical sensors, Laser crystals, Electro optics, Electric field sensors, Temperature metrology

PROCEEDINGS ARTICLE | October 7, 2008
Proc. SPIE. 7114, Electro-Optical Remote Sensing, Photonic Technologies, and Applications II
KEYWORDS: Refractive index, Modulation, Birefringence, Sensors, Crystals, Transducers, High power microwaves, Laser beam diagnostics, Dielectric polarization, Temperature metrology

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