Dr. Maxime Chambonneau
at Friedrich Schiller University Jena
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume PC12411, PC124110O (2023) https://doi.org/10.1117/12.2658867
KEYWORDS: Ultrafast phenomena, Silicon, Semiconductor lasers, Laser processing, Refractive index, Nonlinear crystals, Laser crystals, Crystals, Waveguides, Transparency

Proceedings Article | 17 March 2023 Presentation + Paper
Maxime Chambonneau, Qingfeng Li, Markus Blothe, Vladimir Yu. Fedorov, Stelios Tzortzakis, Stefan Nolte
Proceedings Volume 12409, 1240903 (2023) https://doi.org/10.1117/12.2652940
KEYWORDS: Silicon, Ultrafast lasers, Semiconductor lasers, Interfaces, Gold, Laser damage threshold, Laser bonding, Ultrafast phenomena, Laser welding, Film thickness

Proceedings Article | 5 March 2021 Presentation
Markus Blothe, Maxime Chambonneau, Tobias Heuermann, Martin Gebhardt, Jens Limpert, Stefan Nolte
Proceedings Volume 11673, 116730L (2021) https://doi.org/10.1117/12.2579333
KEYWORDS: Silicon, Picosecond phenomena, Semiconductor lasers, Semiconducting wafers, Laser development, Wafer-level optics, Wafer dicing, Microelectronics, Fiber lasers, Femtosecond phenomena

Proceedings Article | 5 March 2021 Presentation + Paper
Maxime Chambonneau, Qingfeng Li, Vladimir Fedorov, Markus Blothe, Stelios Tzortzakis, Stefan Nolte
Proceedings Volume 11676, 1167610 (2021) https://doi.org/10.1117/12.2579220
KEYWORDS: Semiconductors, Semiconductor lasers, Ultrafast lasers, Laser welding, Interfaces, Wave propagation, Silicon, Raman spectroscopy, Polymers, Microelectronics

Proceedings Article | 9 March 2020 Presentation
Maxime Chambonneau, Markus Blothe, Vladimir Fedorov, Tobias Heuermann, Gabor Matthäus, Alessandro Alberucci, Jens Limpert, Stylianos Tzortzakis, Stefan Nolte
Proceedings Volume 11270, 112700E (2020) https://doi.org/10.1117/12.2545820
KEYWORDS: Silicon, Semiconductor lasers, Femtosecond phenomena, Ultrafast phenomena, Fiber lasers, Picosecond phenomena, Aspheric lenses, Microscopes, Infrared microscopy, Infrared radiation

Showing 5 of 11 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top