Dr. Meghan Shilling
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Carbon, Optical spheres, X-ray computed tomography, Sensors, Calibration, Radiography, Manufacturing, Ray tracing, Distance measurement, Standards development

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