Mehmet Serdar Dogan
at Texas Tech Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 24, 2005
Proc. SPIE. 5679, Machine Vision Applications in Industrial Inspection XIII
KEYWORDS: Statistical analysis, Imaging systems, Image segmentation, Scanners, Particles, X-rays, Image analysis, Image filtering, Electronic filtering, X-ray imaging

PROCEEDINGS ARTICLE | May 3, 2004
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Signal attenuation, Image segmentation, Image processing, Particles, X-rays, Tomography, Image classification, X-ray imaging, Fuzzy logic, 3D image processing

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