Mei Dong
at Chinese Univ of Hong Kong
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 February 2006
Proc. SPIE. 6070, Machine Vision Applications in Industrial Inspection XIV
KEYWORDS: Mirrors, Imaging systems, Cameras, Matrices, Inspection, Image resolution, 3D modeling, Wafer inspection, Semiconducting wafers, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top