Dr. Meik Panitz
at JENOPTIK Optical Systems GmbH
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 24, 2004
Proc. SPIE. 5348, MOEMS Display and Imaging Systems II
KEYWORDS: Oxides, Refractive index, Mirrors, Fabry–Perot interferometers, Switches, Switching, Quartz, Dielectrics, Silicon, Reflectivity

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