Melinda Schnoes
ASQ-Certified Manager of Quality at JDSU
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | February 7, 2009
Proc. SPIE. 7229, Vertical-Cavity Surface-Emitting Lasers XIII
KEYWORDS: Wafer-level optics, Oxides, Transceivers, Reliability, Photomasks, Vertical cavity surface emitting lasers, Semiconducting wafers, Failure analysis, Standards development, Temperature metrology

PROCEEDINGS ARTICLE | February 12, 2008
Proc. SPIE. 6908, Vertical-Cavity Surface-Emitting Lasers XII
KEYWORDS: Code division multiplexing, Wafer-level optics, Oxides, Transceivers, Eye, Reliability, Vertical cavity surface emitting lasers, Chlorine, Semiconducting wafers, Temperature metrology

PROCEEDINGS ARTICLE | September 9, 2004
Proc. SPIE. 5380, Optical Data Storage 2004
KEYWORDS: Diffraction, Refractive index, Holograms, Holography, Digital holography, Data storage, Multiplexing, Semiconductor lasers, High dynamic range imaging, Photopolymer media

PROCEEDINGS ARTICLE | September 9, 2004
Proc. SPIE. 5380, Optical Data Storage 2004
KEYWORDS: Signal to noise ratio, Diffraction, Holograms, Holography, Digital holography, Ultraviolet radiation, Multiplexing, Semiconductor lasers, Absorbance, Absorption

PROCEEDINGS ARTICLE | July 1, 2003
Proc. SPIE. 4988, Advanced Optical Data Storage
KEYWORDS: Diffraction, Holograms, Holography, Digital holography, Data storage, Chemistry, Multiplexing, High dynamic range imaging, Volume holography, Holographic materials

PROCEEDINGS ARTICLE | June 4, 2003
Proc. SPIE. 5005, Practical Holography XVII and Holographic Materials IX
KEYWORDS: Diffraction, Holograms, Holography, Digital holography, Data storage, Chemistry, Multiplexing, High dynamic range imaging, Volume holography, Holographic materials

Showing 5 of 8 publications
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