Infrared Detector Dewar Cooler Assembly (IDDCA) is the key component of infrared system, and the reliability of IDDCA determines the reliability of the system and affects the application of the system to a great extent. Reliability research is of great significance for the engineering application of IDDCA. In this paper, research progress of reliability model, failure modes, acceleration factors, and reliability tests on the assemblies are introduced. Optimizing process and life cycle cost during the manufacturing, and evaluating reliability relying on database are described. In addition, the main thought of reliability research on the assemblies is briefly analyzed. This provides a reference for the domestic reliability research of the assemblies.
InSb focal plane array (FPA) detectors which are important components of infrared systems have great influence on
systems' reliability and development. Few researches have been focused on this field in recent years. Therefore, it is
rather essential to carry out reliability test. In the paper, reliability enhancement testing has been carried out on 128×128
elements InSb FPA detectors to discuss the influence of temperature stresses and vibration stresses on structure and
performance. Working boundary conditions of InSb FPA detectors were obtained. Aiming at the failure the corresponding
improvements were adopted, and reliability of detector was enhanced greatly.