Merlin Mikulewitsch
at BIMAQ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Confocal microscopy, Microfluidics, Microscopy, In situ metrology, Luminescence, Reflectivity, Signal detection, Model-based design, Liquids

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