Dr. Mewael Giday Sertsu
Research Fellow at Helmholtz-Zentrum Berlin
SPIE Involvement:
Author
Area of Expertise:
Thin film and multilayer coatings , EUV and X-ray optics , EUV scattering as a surface technique , Vacuum instrumentation , Radiation damage analysis , Nanomagnetics on hetrostructure multilayers
Profile Summary

I studies Physics and Photonics in my bachelor and masters programs. After 3 years of physics undergraduate teaching, I pursued a PhD research on EUV and X-ray optics. I have done research on thin film and multilayer coatings of high reflectivity performances in EUV and soft X-ray wavelengths. A major task ,however, was to come up with sensitive and reliable metrology techniques to characterize the interdiffuion of multilayers. A grazing incidence based EUV reflectometry was proposed as robust technique to derive structural, optical and chemical properties interdiffuion layers in multilayers.

Deposition of B4C/Ceo2 MLs to study the performance as a possible candidate for the 6.x nm beyond EUV lithogrpahy was performed. optical properties of ceo2 determined experimentally in this range for the first time, interdiffusion of B4C/Ceo2 investigated, and ways of optimizing deposition of such combinations are reccommended for future work. I have worked also on tabletop EUV scattering experiments as surface techniques based on high-brightness DPP sources. A prototype of such tabletop EUV scattering was attempted to study surface morphology of nanostructures non-destructively and with fast scanning.

Research interests:
- X-ray absorption spectroscopies
- development of magnetic hetrostructure thin films and studying the impacts of interface diffusion , layer thicknesses and depsition qualities on the magnetic properties
- Coating and characterization of oxides
- EUV and X-ray optics related in general
- irradiation damage analysis of thin films or nano structures
Publications (7)

PROCEEDINGS ARTICLE | August 6, 2018
Proc. SPIE. 10698, Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave
KEYWORDS: Observatories, Modulation, Polarization, Calibration, Crystals, Wave plates, Polarimetry, Coronagraphy, Liquid crystals, Liquids

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Carbon, Optical components, X-ray optics, Metrology, Contamination, X-rays, Reflectivity, Reflectometry, Synchrotron radiation, Scanning tunneling microscopy

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9511, Damage to VUV, EUV, and X-ray Optics V
KEYWORDS: Solar energy, Sun, X-rays, Ions, Silicon, Reflectivity, Extreme ultraviolet, Molybdenum, Grazing incidence, Solar processes

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Multilayers, X-rays, Interfaces, Diffusion, Reflectivity, Scanning electron microscopy, Extreme ultraviolet, Boron, Extreme ultraviolet lithography, Grazing incidence

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Thin films, Refractive index, X-ray optics, Titanium, Titanium dioxide, X-rays, Silicon, Reflectivity, Surface roughness, Extreme ultraviolet

PROCEEDINGS ARTICLE | September 26, 2013
Proc. SPIE. 8862, Solar Physics and Space Weather Instrumentation V
KEYWORDS: Nanostructures, Mirrors, Multilayers, Solar energy, Ultraviolet radiation, Particles, Optical coatings, Reflectivity, Coronagraphy, Extreme ultraviolet

Showing 5 of 7 publications
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