Dr. Michael S. Bakeman
at KLA-Tencor Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 28, 2004
Proc. SPIE. 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
KEYWORDS: Imaging systems, Cameras, Microchannel plates, X-rays, Picosecond phenomena, Modulation transfer functions, Molybdenum, Pulse generators, Pulsed laser operation, Fusion energy

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