Michael Balke
at Technische Univ Braunschweig
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 19 May 2009 Paper
Ü. Sökmen, M. Balke, A. Stranz, S. Fündling, E. Peiner, H.-H. Wehmann, A. Waag
Proceedings Volume 7362, 736213 (2009) https://doi.org/10.1117/12.820917
KEYWORDS: Silicon, Etching, Dry etching, Plasma, Thermoelectric materials, Silicon films, Photoresist materials, Cryogenics, Thin films, Oxides

Proceedings Article | 15 May 2007 Paper
Erwin Peiner, Lutz Doering, Michael Balke, Andreas Christ
Proceedings Volume 6589, 65890M (2007) https://doi.org/10.1117/12.721951
KEYWORDS: Calibration, Sensors, Silicon, Metrology, Glasses, Dimensional metrology, Etching, Atomic force microscopy, Standards development, Wheatstone bridges

Proceedings Article | 15 May 2007 Paper
M. Balke, E. Peiner, L. Doering
Proceedings Volume 6589, 65890J (2007) https://doi.org/10.1117/12.724163
KEYWORDS: Sensors, Etching, Calibration, Silicon, Wheatstone bridges, Device simulation, Semiconducting wafers, Resistors, Wet etching, Potassium

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