Dr. Michael Conroy
Application Scientist at AMETEK Taylor Hobson Ltd
SPIE Involvement:
Publications (5)

Proceedings Article | 15 October 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Optical components, Metrology, Lenses, Coating, Optical coatings, Interferometry, Optical testing, 3D metrology, Aspheric lenses, Optics manufacturing

Proceedings Article | 18 February 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Thin films, Refractive index, Glasses, Interfaces, Surface roughness, Interferometry, Objectives, Optical interferometry, Thin film coatings, Polymer thin films

Proceedings Article | 18 June 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Thin films, Refractive index, Silica, Polymers, Glasses, Interferometry, Optical testing, Objectives, Optical interferometry, Polymer thin films

Proceedings Article | 27 April 2006
Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology
KEYWORDS: Confocal microscopy, Microscopes, Light sources, Metrology, Interferometers, Sensors, Interferometry, Phase interferometry, Objectives, Optical interferometry

Proceedings Article | 19 August 2005
Proc. SPIE. 5872, Advancements in Polymer Optics Design, Fabrication, and Materials
KEYWORDS: Diamond turning, Diamond, Metrology, Diamond machining, Visualization, Interferometry, Platinum, Signal processing, 3D metrology, Correlation function

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