Michael R. Douglass
Quality and Reliability Engineering Manager at
SPIE Involvement:
Senior status | Conference Chair | Symposium Committee | Editor | Author
Area of Expertise:
MEMS , Reliability , DMD
Websites:
Profile Summary

Mike Douglass is a distinguished member of the technical staff at Texas Instruments. He has been a reliability engineer with TI since 1979 and has worked on a variety of programs ranging from defense systems to commercial navigation equipment. In 1992, he joined DLP® Products to support reliability development of the Digital Micromirror Device (DMD) and DLP technology. Mike received the Bachelor of Science degree in electrical engineering from the University of Connecticut (1979) and an MBA from the University of Dallas (1985).

He is a senior member of the IEEE Reliability Society, a senior member of SPIE and is a registered professional engineer in the state of Texas.
Publications (13)

Showing 5 of 13 publications
Conference Committee Involvement (12)
Emerging Digital Micromirror Device Based Systems and Applications XI
5 February 2019 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications X
30 January 2018 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications IX
31 January 2017 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications VIII
15 February 2016 | San Francisco, California, United States
Emerging Digital Micromirror Device Based Systems and Applications VII
10 February 2015 | San Francisco, California, United States
Showing 5 of 12 published special sections
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