Prof. Michael C. Downer
at Univ of Texas at Austin
SPIE Involvement:
Conference Chair | Author | Editor
Publications (10)

PROCEEDINGS ARTICLE | December 4, 2003
Proc. SPIE. 5223, Physical Chemistry of Interfaces and Nanomaterials II
KEYWORDS: Second-harmonic generation, Polarization, Nanoparticles, Glasses, Spectroscopy, Interfaces, Silicon, Signal generators, Nanocrystals, Signal detection

PROCEEDINGS ARTICLE | March 15, 1999
Proc. SPIE. 3734, ICONO '98: Fundamental Aspects of Laser-Matter Interaction and New Nonlinear Optical Materials and Physics of Low-Dimensional Structures
KEYWORDS: Oxides, Refractive index, Second-harmonic generation, Chemical species, Dielectrics, Interfaces, Silicon, Solids, Harmonic generation, Electromagnetism

PROCEEDINGS ARTICLE | April 30, 1998
Proc. SPIE. 3272, Laser Techniques for Surface Science III
KEYWORDS: Second-harmonic generation, Femtosecond phenomena, Polarization, Spectroscopy, Interfaces, Silicon, Hydrogen, Ultrafast lasers, Harmonic generation, Spectroscopes

PROCEEDINGS ARTICLE | April 12, 1996
Proc. SPIE. 2770, Laser Optics '95 and ICONO '95: Superintense Laser Fields
KEYWORDS: Femtosecond phenomena, Polarization, Chemical species, Gases, Laser applications, Wave propagation, Ionization, Extreme ultraviolet, High harmonic generation, Pulsed laser operation

PROCEEDINGS ARTICLE | September 14, 1994
Proc. SPIE. 2337, Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing
KEYWORDS: Oxides, Second-harmonic generation, Femtosecond phenomena, Polarization, Interfaces, Silicon, Chemical vapor deposition, Atomic force microscopy, Data acquisition, Focus stacking software

PROCEEDINGS ARTICLE | May 16, 1994
Proc. SPIE. 2116, Generation, Amplification, and Measurement of Ultrashort Laser Pulses
KEYWORDS: Mirrors, Femtosecond phenomena, Sensors, Mode locking, Gallium arsenide, Nd:YAG lasers, Interferometry, Laser stabilization, Picosecond phenomena, Pulsed laser operation

Showing 5 of 10 publications
Conference Committee Involvement (1)
Ultrafast Spectroscopy of Advanced Electronic and Optoelectronic Materials
18 January 1993 | Los Angeles, CA, United States
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