Michael J. Elko
Optical Engineer
SPIE Involvement:
Author
Area of Expertise:
optical analysis , Zemax , fiber optics , space-based imagers
Publications (2)

Proceedings Article | 28 September 1999
Proc. SPIE. 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II
KEYWORDS: Mirrors, Spectrographs, Imaging systems, Scattering, Sensors, Calibration, Ultraviolet radiation, Light scattering, Collimation, Optical calibration

Proceedings Article | 15 June 1994
Proc. SPIE. 2223, Characterization and Propagation of Sources and Backgrounds
KEYWORDS: Semiconductors, Vanadium, Diamond, Switching, Reflectivity, Chemical vapor deposition, Spatial light modulators, Diodes, Infrared radiation

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