Michael Farrier
Sr. Engineer at Teledyne Rad-icon Imaging Corp
SPIE Involvement:
Publications (8)

Proceedings Article | 19 March 2014 Paper
Proceedings Volume 9033, 90331G (2014) https://doi.org/10.1117/12.2043770
KEYWORDS: Modulation transfer functions, X-rays, X-ray imaging, CMOS sensors, Imaging systems, Sensors, Spatial resolution, Selenium, X-ray detectors, Gold

Proceedings Article | 15 May 2000 Paper
Kohji Mitani, Masayuki Sugawara, Hiroshi Shimamoto, Charles Smith, Michael Farrier, Queintin Tang, Fumio Okano
Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385437
KEYWORDS: Cameras, Imaging systems, Charge-coupled devices, Video, Digital signal processing, Signal processing, CCD cameras, Image resolution, Analog electronics, Image quality

Proceedings Article | 5 November 1998 Paper
William Pfister, James Steele, Michael Farrier, Charles Smith
Proceedings Volume 3431, (1998) https://doi.org/10.1117/12.330197
KEYWORDS: Charge-coupled devices, Staring arrays, Cameras, CCD image sensors, Reconnaissance, Amplifiers, Data conversion, Metals, Electro optics, Electrons

Proceedings Article | 1 May 1994 Paper
Stacy Kamasz, Michael Farrier, Shing-Fat Ma, Robert Sabila, Savvas Chamberlain
Proceedings Volume 2172, (1994) https://doi.org/10.1117/12.172766
KEYWORDS: Clocks, Metals, Sensors, Image sensors, CCD image sensors, Resistance, Image segmentation, Capacitance, Sensor technology, Reconnaissance

Proceedings Article | 1 May 1994 Paper
Stacy Kamasz, Michael Farrier, Charles Smith
Proceedings Volume 2172, (1994) https://doi.org/10.1117/12.172768
KEYWORDS: Charge-coupled devices, Photons, Silicon, Near infrared, Imaging systems, Visible radiation, X-rays, Electrons, Semiconducting wafers, X-ray imaging

Showing 5 of 8 publications
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