Dr. Michael Feser
CEO at Lyncean Technologies Inc
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 16 October 2017 Paper
Proc. SPIE. 10450, International Conference on Extreme Ultraviolet Lithography 2017
KEYWORDS: Extreme ultraviolet, Free electron lasers, Light sources, Lithography, X-rays, Synchrotron technology, Clouds, Atmospheric particles, Electron beams, Synchrotrons

Proceedings Article | 19 September 2017 Presentation
Proc. SPIE. 10387, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI

Proceedings Article | 18 September 2015 Paper
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: X-rays, Image resolution, X-ray microscopy, X-ray imaging, 3D image processing, Stereoscopy, Microscopes, Crystals, Synchrotrons, Polymers

Proceedings Article | 9 September 2009 Paper
Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV
KEYWORDS: Zone plates, Image filtering, Tungsten, Copper, Cobalt, Optical filters, X-rays, X-ray sources, Photons, Synchrotrons

Proceedings Article | 22 May 2009 Paper
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: Tissues, Image resolution, Bone, X-rays, Tissue optics, 3D image processing, X-ray computed tomography, Tomography, Organisms, Cartilage

Showing 5 of 12 publications
Conference Committee Involvement (3)
X-Ray Nanoimaging: Instruments and Methods III
7 August 2017 | San Diego, California, United States
X-Ray Nanoimaging: Instruments and Methods II
12 August 2015 | San Diego, California, United States
X-Ray Nanoimaging: Instruments and Methods
28 August 2013 | San Diego, California, United States
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