Dr. Michael Gisi
at OHB-System AG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 June 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optomechanical components, FT-IR spectroscopy, Environmental monitoring, Statistical analysis, Interferometers, Spectroscopy, Gases, Interferometry, Optical testing, Infrared lasers, Precision measurement, Software development, Infrared radiation, Space operations, Michelson interferometers

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