Michael Hossfeld
at Technische Univ Hamburg Harburg
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | February 9, 2006
Proc. SPIE. 6070, Machine Vision Applications in Industrial Inspection XIV
KEYWORDS: Light sources, Light emitting diodes, Reflection, Cameras, Image segmentation, Image processing, Photography, Reflectivity, Feature extraction, Image sensors

PROCEEDINGS ARTICLE | May 22, 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Light sources, Light emitting diodes, Reflection, Cameras, Image segmentation, Image processing, Photography, Reflectivity, Image classification, Classification systems

PROCEEDINGS ARTICLE | March 8, 2002
Proc. SPIE. 4661, Three-Dimensional Image Capture and Applications V
KEYWORDS: Light sources, Reflection, Cameras, Image segmentation, Image processing, Photography, Reflectivity, Image classification, Convolution, Classification systems

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