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Michael E. Jacob
at Oregon State Univ
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Author
Publications (1)
Proceedings Article | 9 September 2008 Paper
Ultra low capacitance high frequency IC probe
M. Jacob, D. Miller, L. Forbes
Proceedings Volume 7042, 704203 (2008) https://doi.org/10.1117/12.792137
KEYWORDS: Capacitance, Capacitors, Tungsten, Fourier transforms, Calibration, Capacitive coupling, 3D modeling, Integrated circuits, Advanced distributed simulations, Device simulation
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