Michael E. Jacob
at Oregon State Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 9, 2008
Proc. SPIE. 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II
KEYWORDS: Capacitors, Calibration, Tungsten, Fourier transforms, 3D modeling, Capacitance, Integrated circuits, Capacitive coupling, Device simulation, Advanced distributed simulations

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