Michael A. Kellner
at Univ Passau
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 March 2002
Proc. SPIE. 4664, Machine Vision Applications in Industrial Inspection X
KEYWORDS: Edge detection, Detection and tracking algorithms, Visualization, Sensors, Image processing, Distortion, Image analysis, CCD cameras, Distance measurement, Algorithm development

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