We present in this paper the status of the optics production and illustrate not only recent X-ray results but also the progress made on the environmental testing, manufacturing and assembly aspects of SPO based optics.
The Silicon Pore Optics (SPO) enables the NewAthena mission, delivering an unprecedented combination of good angular resolution, large effective area and low mass. The SPO technology builds significantly on spin-in from the semiconductor industry and is designed to allow a cost-effective flight optics implementation, compliant with the programmatic requirements of the mission.
The NewAthena X-ray optics is highly modular, consisting of hundreds of compact mirror modules arranged in concentric circles and mounted on a metallic optical bench. All aspects of the optics are being developed in parallel, from the industrial production of the mirror plates, over the highly efficient assembly into mirror modules, to the alignment of the mirror modules and their fixation on the optical bench. Dedicated facilities are being built to measure the performance of the NewAthena X-ray telescope optics, demonstrating their compatibility with the environmental and scientific requirements.
An overview is provided of the activities preparing the implementation of the NewATHENA optics.
A key aspect of the thin film coating development for the NewATHENA X–ray optics, is to determine the adhesion efficiency and the residual stress limitation of the coatings on silicon substrates. To do so, we magnetron sputtered different layer thicknesses of chromium layers underneath iridium/carbon bilayer and linear graded multilayer coatings. The samples were characterized using X–ray Reflectometry (XRR) to derive the thickness and micro–roughness. The residual stress was assessed by profilometry using a Dektak 150 stylus profilometer. The curvature of the samples before and after coating, along with the total film thickness derived from XRR, was used to evaluate the residual stress.
The next generation x-ray observatory ATHENA (advanced telescope for high energy astrophysics) requires an optics with unprecedented performance. It is the combination of low mass, large effective area and good angular resolution that is the challenge of the x-ray optics of such a mission. ATHENA is the second large class mission in the science programme of ESA, and is currently in a reformulation process, following a design-to-cost approach to meet the cost limit of an ESA L-class mission.
The silicon pore optics (SPO) is the mission enabler being specifically developed for ATHENA, in a joint effort by industry, research institutions and ESA. All aspects of the optics are being addressed, from the mirror plates and their coatings, over the mirror modules and their assembly into the ATHENA telescope, to the facilities required to build and test the flight optics, demonstrating performance, robustness, and programmatic compliance.
The SPO technology is currently being matured to the level required for the adoption of the ATHENA mission, i.e., the start of the mission implementation phase. The monocrystalline silicon material and pore structure of the SPO provide these optics with excellent thermal and mechanical properties. Benefiting from technology spin-in from the semiconductor industry, the equipment, processes, and materials used to produce the SPO are highly sophisticated and optimised.
Future high energy astrophysics missions will require high performance novel X-ray optics to explore the Universe beyond the limits of the currently operating Chandra and Newton observatories. Innovative optics technologies are therefore being developed and matured by the European Space Agency (ESA) in collaboration with research institutions and industry, enabling leading-edge future science missions.
Silicon Pore Optics (SPO) [1 to 21] and Slumped Glass Optics (SGO) [22 to 29] are lightweight high performance X-ray optics technologies being developed in Europe, driven by applications in observatory class high energy astrophysics missions, aiming at angular resolutions of 5” and providing effective areas of one or more square meters at a few keV.
This paper reports on the development activities led by ESA, and the status of the SPO and SGO technologies, including progress on high performance multilayer reflective coatings [30 to 35]. In addition, the progress with the X-ray test facilities and associated beam-lines is discussed [36].
Silicon Pore Optics is an enabling technology for future L- and M-class astrophysics X-ray missions, which require high angular resolution (~5 arc seconds) and large effective area (1 to 2 m2 at a few keV). The technology exploits the high-quality of super-polished 300 mm silicon wafers and the associated industrial mass production processes, which are readily available in the semiconductor industry. The plan-parallel wafers have a surface roughness better than 0.1 nm rms and are diced, structured, wedged, coated, bent and stacked to form modular Silicon Pore Optics, which can be grouped into a larger optic. The modules are assembled from silicon alone, with all the mechanical advantages, and form an intrinsically stiff pore structure.
The optics design was initially based on long (25 to 50 m) focal length X-ray telescopes, which could achieve several arc second angular resolution by curving the silicon mirror in only one direction (conical approximation).
Recently shorter focal length missions (10 to 20 m) have been discussed, for which we started to develop Silicon Pore Optics having a secondary curvature in the mirror, allowing the production of Wolter-I type optics, which are on axis aberration-free.
In this paper we will present the new manufacturing process, the results achieved and the lessons learned.
The characterization of large aperture (> 2 meters), long focal length (> 10 meters) X-ray mirrors for X-ray astronomy with synchrotron radiation poses signi cant problems related to the available space at synchrotron radiation facilities. Intrafocal pencil beam characterization of part of the optics is advantageous if its results can be shown to have predictive capabilities with respect to the full system.
In this paper we present the routine characterization of silicon pore optics at the X-ray Pencil Beam Facility of the Physikalisch-Technische Bundesanstalt, located at the synchrotron radiation facility BESSY II (Berlin, Germany). In particular we show how measurements taken in the standard beamline con guration (detector at ve meters from the optics) can e ectively be used to predict the optical performance of the optics at their design focal length by comparing data taken on 20-meter focal length Silicon Pore Optics unit in the 20-meter beamline con guration (available only for a few weeks every year) with extrapolated 5-meter measurements.
Silicon Pore Optics (SPO) is a lightweight high performance X-ray optics technology being developed in Europe, driven by applications in observatory class high energy astrophysics missions. An example of such application is the former ESA science mission candidate ATHENA (Advanced Telescope for High Energy Astrophysics), which uses the SPO technology for its two telescopes, in order to provide an effective area exceeding 1 m2 at 1 keV, and 0.5 m2 at 6 keV, featuring an angular resolution of 10” or better [1 to 24].
This paper reports on the development activities led by ESA, and the status of the SPO technology. The technology development programme has succeeded in maturing the SPO further and achieving important milestones, in each of the main activity streams: environmental compatibility, industrial production and optical performance. In order to accurately characterise the increasing performance of this innovative optical technology, the associated X-ray test facilities and beam-lines have been refined and upgraded.