Mr. Michael L. Morley Profile

Michael L. Morley

at EPIR Technologies Inc

SPIE Involvement:

Author

Publications (5)

SPIE Journal Paper | 13 March 2014

Design and fabrication of Fabry–Perot filters for infrared hyperspectral imagers

Michael Morley, Silviu Velicu, Yong Chang, Christoph Grein, Dmitry Kozak, Bautista Fernandez, Joel Kubby, Neelam Gupta

JM3, Vol. 13, Issue 01, 011116, (March 2014) https://doi.org/10.1117/12.10.1117/1.JMM.13.1.011116

KEYWORDS: Electronic filtering, Reflectivity, Infrared imaging, Hyperspectral imaging, Imaging systems, Optical filters, Infrared radiation, Semiconducting wafers, Image filtering, Surface roughness

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Proceedings Article | 24 September 2013 Paper

Two color high operating temperature HgCdTe photodetectors grown by molecular beam epitaxy on silicon substrates

S. Velicu, R. Bommena, M. Morley, J. Zhao, S. Fahey, V. Cowan, C. Morath

Proceedings Volume 8876, 887608 (2013) https://doi.org/10.1117/12.2025301

KEYWORDS: Sensors, Long wavelength infrared, Mid-IR, Mercury cadmium telluride, Infrared detectors, Photodiodes, Quantum efficiency, Photodetectors, Molecular beam epitaxy, Instrument modeling

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Proceedings Article | 5 March 2013 Paper

Hyperspectral Fabry-Perot filters for HgCdTe infrared detectors

Yong Chang, Christoph Grein, Silviu Velicu, Michael Morley, Neelam Gupta

Proceedings Volume 8613, 861316 (2013) https://doi.org/10.1117/12.2007508

KEYWORDS: Electronic filtering, Long wavelength infrared, Reflectivity, Spectral resolution, Mercury cadmium telluride, Interfaces, Optical filters, Sensors, Infrared detectors, Zinc

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Proceedings Article | 21 January 2012 Paper

Theoretical and experimental investigation of MWIR HgCdTe nBn detectors

Silviu Velicu, Jun Zhao, Michael Morley, Anne Itsuno, Jamie Phillips

Proceedings Volume 8268, 82682X (2012) https://doi.org/10.1117/12.904916

KEYWORDS: Mercury cadmium telluride, Mid-IR, Doping, Sensors, Instrument modeling, Heterojunctions, Infrared detectors, Temperature metrology, Optical testing, Photodiodes

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Proceedings Article | 14 February 2011 Paper

Fabrication and testing of MEMS-based optical filter combined with a HgCdTe detector

Dmitry Kozak, Bautista Fernandez, Michael Morley, Silviu Velicu, Joel Kubby

Proceedings Volume 7930, 79300L (2011) https://doi.org/10.1117/12.874345

KEYWORDS: Silicon, Semiconducting wafers, Etching, Optical filters, Sensors, Mid-IR, Oxides, Reflectivity, Germanium, Mercury cadmium telluride

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