Michael L. Morley
at EPIR Technologies Inc
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | March 13, 2014
JM3 Vol. 13 Issue 01
KEYWORDS: Electronic filtering, Reflectivity, Infrared imaging, Hyperspectral imaging, Imaging systems, Optical filters, Infrared radiation, Semiconducting wafers, Image filtering, Surface roughness

PROCEEDINGS ARTICLE | September 24, 2013
Proc. SPIE. 8876, Nanophotonics and Macrophotonics for Space Environments VII
KEYWORDS: Infrared detectors, Long wavelength infrared, Mid-IR, Photodetectors, Mercury cadmium telluride, Sensors, Quantum efficiency, Photodiodes, Molecular beam epitaxy, Instrument modeling

PROCEEDINGS ARTICLE | March 5, 2013
Proc. SPIE. 8613, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics VI
KEYWORDS: Infrared detectors, Long wavelength infrared, Optical filters, Mercury cadmium telluride, Sensors, Interfaces, Reflectivity, Zinc, Spectral resolution, Electronic filtering

PROCEEDINGS ARTICLE | January 21, 2012
Proc. SPIE. 8268, Quantum Sensing and Nanophotonic Devices IX
KEYWORDS: Infrared detectors, Mid-IR, Mercury cadmium telluride, Sensors, Doping, Photodiodes, Optical testing, Heterojunctions, Temperature metrology, Instrument modeling

PROCEEDINGS ARTICLE | February 14, 2011
Proc. SPIE. 7930, MOEMS and Miniaturized Systems X
KEYWORDS: Oxides, Mid-IR, Optical filters, Mercury cadmium telluride, Sensors, Etching, Germanium, Silicon, Reflectivity, Semiconducting wafers

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